FRINGE CLASS
A compact and precise benchtop X-ray diffractometer for powder, bulk and thin-film samples.
It combines phase analysis, crystal-structure investigation and crystallinity measurement with CrystalX software and a DPPC detector for materials research and quality control.
Developed by LANScientific, this system is supplied with DeneyLab sales and technical support.
Features
Alumina
Graphitization degree
Ceramics
Asbestos
Cement
Pharmaceutical analysis
Talc
Technical Parameters
| Goniometer | Vertical θ–θ goniometer, 150 mm diffraction-circle radius |
|---|---|
| 2θ measuring range | −3° to +150° |
| Precision | Full-spectrum deviation < ±0.02° |
| Dimensions | 620 × 485 × 780 mm (L × W × H) |
| Weight | Approximately 120 kg, depending on configuration |
| Power supply | 220 V ±10 V, 50 Hz |
| Interface | USB connection for PC control |
| Goniometer geometry | Linked θ–2θ vertical system |
| X-ray tube | Metal-ceramic, up to 2.2 kW; Cu standard, Co/Cr/Mo optional |
| Generator output | Up to 600 W |
| Cooling | Built-in recirculating water |
| Detector | DPPC |
Advantages
Large access door
A gas-spring lift door provides convenient sample access.
Built-in cooling
Recirculating-water cooling without an external chiller.
DPPC detector
Digital pulse processing for fast and stable data collection.
Safety interlock
An enclosed chamber and interlock prevent X-ray exposure.