FRINGE EVS
A benchtop XRD system with a high-resolution DPPS detector for research and industrial quality control.
Built-in water cooling, a 1200 W generator and CrystalX software enable precise phase and crystallinity analysis of powders, bulk samples and thin films.
Developed by LANScientific, this system is supplied with DeneyLab sales and technical support.
Features
Thin films
Biopharmaceuticals
Research and education
Technical Parameters
| Goniometer | Vertical θ–θ goniometer, 150 mm diffraction-circle radius |
|---|---|
| 2θ measuring range | −3° to +150° |
| Precision | Full-spectrum deviation < ±0.02° |
| Dimensions | 620 × 485 × 780 mm (L × W × H) |
| Weight | Approximately 120 kg, depending on configuration |
| Power supply | 220 V ±10 V, 50 Hz |
| Interface | USB connection for PC control |
| X-ray tube | Metal-ceramic, up to 2.2 kW; Cu target |
| Generator output | Up to 1200 W |
| Cooling | Built-in recirculating water |
| Detector | DPPS |
Advantages
High resolution
The DPPS detector captures detailed diffraction data.
Integrated design
The cooling system is built into the enclosure.
Versatile analysis
Supports phase, structure and crystallinity studies.
Accessory options
Configurable for different research requirements.