FRINGE PLUS
A next-generation benchtop XRD system combining 3 kW power with an Xeye2D detector for high-resolution analysis.
A ≥200 mm diffraction radius, high count rate and strong signal-to-noise performance suit weakly diffracting and trace-level samples.
Developed by LANScientific, this system is supplied with DeneyLab sales and technical support.
Features
Chemical industry
Mining and geochemistry
Scientific research
Semiconductors
Biomedicine
Technical Parameters
| Goniometer | Vertical θ–θ; diffraction-circle radius ≥200 mm |
|---|---|
| 2θ measuring range | −3° to +150° |
| Precision | Full-spectrum deviation < ±0.02° |
| Generator output | Up to 3000 W |
| Detector | Xeye2D; ≥65,536 sub-pixels, ≤55 µm pixel size |
| Dimensions | 780 × 570 × 950 mm (L × W × H) |
| Weight | Approximately 170 kg, depending on configuration |
| Power supply | 220 V ±10 V, 50 Hz |
| Cooling | External recirculating water |
Advantages
3 kW high power
Provides strong excitation for weak and trace-level signals.
Xeye2D
Hybrid-pixel detector supporting 0D, 1D and 2D modes.
High resolution
A ≥200 mm diffraction radius supports precise angular measurements.
Intelligent analysis
CrystalX automates phase identification and quantitative analysis.