FRINGE
A user-friendly benchtop X-ray diffractometer for routine phase and crystal-structure analysis.
It combines XRD hardware, a DPPC detector and CrystalX software in a compact enclosure for stable measurement of powders, bulk samples and thin films.
Developed by LANScientific, this system is supplied with DeneyLab sales and technical support.
Features
Metal materials
Chemistry and catalysts
Research and education
Pharmaceuticals
Ceramics and cement
Technical Parameters
| Goniometer | Vertical θ–θ goniometer, 150 mm diffraction-circle radius |
|---|---|
| 2θ measuring range | −3° to +150° |
| Precision | Full-spectrum deviation < ±0.02° |
| Dimensions | 620 × 485 × 780 mm (L × W × H) |
| Weight | Approximately 120 kg, depending on configuration |
| Power supply | 220 V ±10 V, 50 Hz |
| Interface | USB connection for PC control |
| X-ray tube | Metal-ceramic, up to 2.2 kW; Cu standard, Co/Cr/Mo optional |
| Generator output | Up to 600 W |
| Cooling | Built-in recirculating water |
| Detector | DPPC, counting throughput ≥1 × 10⁷ CPS |
Advantages
Compact platform
A benchtop format for routine laboratory workflows.
DPPC detector
Fast acquisition with a counting throughput of ≥1 × 10⁷ CPS.
Built-in water cooling
Eliminates the need for an additional chiller.
Automated analysis
CrystalX automates phase analysis and component percentages.