INSIGHT Universal Version for Small Parts
The INSIGHT Coating Analyzer uses a micro-focused X-ray tube to collect most of the rays from the X-ray source and focus them onto a micro-spot. This spot irradiates the sample position, achieving good spatial resolution and a strong fluorescent signal. The device collects, processes, and evaluates the fluorescent signal generated after the sample is irradiated via the sample’s energy spectrum probe and subsequent data processor, obtaining the compositional information of the sample. It provides fast measurement and precise analysis for more complex applications and is ideal for elemental analysis of heterogeneous or irregularly shaped unknown samples and microscopic objects.
The INSIGHT Coating Analyzer is a "top-down" coating analyzer featuring a compact design, space-saving structure, ease of use, rapid analysis, and precise detection capabilities. It is widely used for elemental analysis and thickness measurement of samples with traditional and complex coating structures, especially those with irregular, uneven, or even small shapes. Additionally, it ensures customers obtain reliable and repeatable results for hundreds of applications, including jewelry, small parts, connector coatings, general circuit boards, and more.
Gallery
Features
Jewelry, Electroplating protects jewelry and adds aesthetics. Standards vary by country.
Bath products, Hot air leveling, OSP, ENIG, immersion silver, immersion tin, and other methods are widely used in PCB surface treatments. INSIGHT quickly, efficiently, non-destructively, and accurately analyzes different PCB coating thicknesses and compositions.
Technical Parameters
| The characteristics of | Top-down measurement structure, XYZ measurement platform, MUTI-FP multilayer algorithm |
| Scope of element | Na(11)—Fm(100) |
| Analysis of the layer number of | 5 layers (4 layers + substrate) each layer can analyze 10 elements, composition analysis can analyze up to 25 elements |
| X-ray tube | 50 W (50 kV, 1mA) micro-focused tungsten palladium ray tube (target material is optional) |
| The detector | Si-PIN large area detector |
| Collimator | φ0.05-φ1 is optional. Multi-standard is optional |
| The camera | High resolution CMOS color camera, 5 megapixels |
| Manual sample XY platform | Moving range：100 x 150 mm |
| Programmable XY platform | (Optional) |
| Z-axis range of movement | 150 mm |
| Sample bin size | 564×540×150 mm (L x W x H) |
| Overall dimensions | 664×761×757 mm (L x W x H) |
| weight | 120KG |
| The power supply | AC 220V±5V 50Hz(The configuration varies slightly by region) |
| Rated power | 150W |
Advantages
Multiple collimator
Multiple collimators can be used optionally, or combinations of multiple collimators can be automatically switched by the software, allowing flexible handling of parts of different sizes.
One touch measurement
The device is equipped with easy-to-use, intuitive, and intelligent analysis software. Anyone can test samples without any training. Simply click “Start Test,” and you can obtain the test results within seconds.
Autofocus
Samples of various shapes can be quickly and clearly focused, video images can be zoomed in, with crosshair and automatic focusing.
High performance imported detector
We select Si-PIN detectors suitable for multi-layer coatings. Compared to traditional gas proportional counters, Si-PIN offers better resolution, lower background noise (highest S/N ratio), long-term stability, and a longer service life.
Large measuring chamber
The slotted design of the device body (C-slot) expands the measurement area and facilitates sample placement. It can measure large and flat objects such as printed circuit boards, as well as large samples with complex shapes.
Non-destructive testing
X-ray fluorescence is a non-destructive analytical method that leaves no trace and is very safe for measuring even sensitive materials.