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Deneylab Analiz Sistemleri

X-Ray Diffraction Analyzer / Thin Film Material

Reflectance Measurement, Density, Thickness, Roughness of Films

 Reflection measurement, density, thickness, and roughness detection are of great importance for understanding the optical, physical, and chemical properties of films and optimizing the film preparation process. These parameters are critical factors in determining the performance and behavior of films in many applications.
Reflectance Measurement, Density, Thickness, Roughness of Films

Qualitative Analysis (GID) of Polycrystalline Nanometer-Scale Thin Film Samples

 Polycrystalline nanoscale film is a film material with multiple crystal grains and grain sizes in the nanometer range. This material has a wide range of applications in fields such as nanotechnology, materials science, and engineering. X-ray diffraction (XRD) can assist in the qualitative analysis of polycrystalline nanoscale films by determining the crystal structure type, lattice parameters, and existing crystal phases of the film. In addition, factors such as grain size and lattice distortion can also be estimated through XRD analysis of diffraction peak broadening, providing accurate and reliable qualitative analysis of the film structure.
Qualitative Analysis (GID) of Polycrystalline Nanometer-Scale Thin Film Samples